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Patent drawing for Phase shifting interferometric method, interferometer apparatus and method of manufacturing an optical element
US 7,274,467 B2
Lithography US 7,274,467 B2 Not in force

Phase shifting interferometric method, interferometer apparatus and method of manufacturing an optical element

This invention describes a way to precisely measure objects using light. It works by shining light on an object, combining it with a reference beam, and taking at least four pictures of the resulting interference patterns, each with a slightly different light alignment. The clever part is that it doesn't rely on pre-set light alignments; instead, it figures out the exact alignment changes from the pictures themselves, often by comparing them to a computer simulation to get a highly accurate measurement.

Why it matters: Filed before modern computational power and advanced optimization algorithms were widely available. The core method of determining phase shifts from recorded data using adaptable models is now significantly easier to implement with current software and hardware.

Status
Not in forceListed as no longer active. The specific reason is not in the record we hold.
How hard to build
SpecializedPrecision optics, phase shifter, image sensor, computational model.

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