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Patent drawing for Machine learning-based methods and systems for deffect detection and analysis using ultrasound scans
US 20,220,019,190 A1
Materials testing US 20,220,019,190 A1 Expired

Machine learning-based methods and systems for deffect detection and analysis using ultrasound scans

The invention describes a computer program that uses artificial intelligence to inspect ultrasound images of an object. It automatically finds any defects or unusual areas within a specific section of the object, labels these findings, and then assigns an overall health status to that section. This health status, which might include details like the number or size of defects, is then displayed for review.

Why it matters: Since 2020, the rapid evolution of neural network models and accessible machine learning platforms has significantly improved the accuracy and efficiency of image analysis. This makes building the core aberration detection and labeling system more feasible and effective now.

Status
ExpiredProtection ended and was never renewed
How hard to build
SpecializedMachine learning system, data processing, software integration

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