Methods and Systems for Defects Detection and Classification Using X-rays

This invention describes an automated system that uses X-rays to find flaws in objects. It works by taking an X-ray image of an object and comparing it to a reference model, which is built from X-ray images of other, known-good objects of the same type. If the object's X-ray image deviates from the reference model in ways that match pre-defined defect patterns, it's flagged as defective and classified. The claims narrow this to an automated, high-speed X-ray inspection system that can also account for background noise and use multiple angles for imaging.