Methods and systems for defects detection and classification using X-rays

This invention describes an automated system that uses X-rays to find flaws inside objects. It works by first taking X-ray pictures of known good versions of an object to create a perfect blueprint. Then, it X-rays the object you want to inspect and compares that image to the blueprint to spot any differences, which are then identified as defects and categorized.

Why it matters: Filed before the widespread adoption of advanced deep learning for image analysis. The system's ability to generate reference models and classify defects could now be significantly enhanced by modern AI algorithms.

Status: Not in forceListed as no longer active. The specific reason is not in the record we hold.
How hard to build: SpecializedX-ray hardware, image processing, machine learning software

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