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Patent drawing for Machine learning for metric collection
US 12,099,427 B2
Computing US 12,099,427 B2 Not in force

Machine learning for metric collection

This invention describes a system that keeps an eye on computer networks by gathering performance data, called metrics. Initially, it collects this data at a certain pace. The system then decides if a particular metric is important or "critical," and if so, it starts collecting that specific metric much more frequently to get a detailed view.

Why it matters: Filed before the recent surge in accessible, powerful AI/ML models. The ability to automatically optimize sampling and recommend alert rules, as described, could now leverage more sophisticated and readily available machine learning techniques.

Status
Not in forceListed as no longer active. The specific reason is not in the record we hold.
How hard to build
SpecializedHeavy software system, data pipelines, ML algorithms

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