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Patent drawing for Computer aided inspection system and methods
US 11,270,426 B2
Image processing US 11,270,426 B2 Not in force

Computer aided inspection system and methods

This invention describes a system that helps inspect buildings and other structures. A user moves through a real-world structure with a mobile device that uses sensors to figure out their exact location and match it to a digital 3D model of the structure. Other sensors then take very precise measurements of the structure, and the system compares these measurements to the 3D model to find any differences or errors, generating a report if discrepancies exceed a set threshold.

Why it matters: Filed before widespread consumer AR/VR headsets integrated advanced SLAM and high-resolution sensors. These platforms now offer a robust, off-the-shelf foundation for a mobile inspection system.

Status
Not in forceListed as no longer active. The specific reason is not in the record we hold.
How hard to build
SpecializedHeavy software system, sensor integration, 3D models

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